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Other articles related with "ionizing radiation damage"：
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36102 |
Xiao-Long Li(李小龙), Wu Lu(陆妩), Xin Wang(王信), Xin Yu(于新), Qi Guo(郭旗), Jing Sun(孙静), Mo-Han Liu(刘默寒), Shuai Yao(姚帅), Xin-Yu Wei(魏昕宇), Cheng-Fa He(何承发) |
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Estimation of enhanced low dose rate sensitivity mechanisms using temperature switching irradiation on gate-controlled lateral PNP transistor |
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Chin. Phys. B
2018 Vol.27 (3): 36102-036102
[Abstract]
(674)
[HTML 0 KB]
[PDF 1128 KB]
(233)
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88503 |
Pei Li(李培), Mo-Han Liu(刘默寒), Chao-Hui He(贺朝会), Hong-Xia Guo(郭红霞), Jin-Xin Zhang(张晋新), Ting Ma(马婷) |
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An investigation of ionizing radiation damage in different SiGe processes |
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Chin. Phys. B
2017 Vol.26 (8): 88503-088503
[Abstract]
(712)
[HTML 1 KB]
[PDF 2300 KB]
(318)
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